Year: 2012

Тип публикации: Article

Journal: Technical Physics Letters

Publisher: USA. New York: MAIK NAUKA/Interperiodica/Springer

Output data: Vol. 38, No. 8.

Impact-factor: 0.49

ISSN / ISBN: 0320-0116

Bibliographic description: Vikulov V.A., Balashev V.V., Pisarenko T.A., Dimitriev A.A., Korobtsov V.V. Thin Magnetite Films on an Oxidized Silicon Surface: Raman Spectroscopy Study //Technical Physics Letters, 2012, Vol. 38, No. 4, P. 772–775.

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