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- Characterization of Si(111)root3xroot3-(Au,In) surface by optical second-harmonic generation
Characterization of Si(111)root3xroot3-(Au,In) surface by optical second-harmonic generation
2012
Статьи в журналах
APPLIED SURFACE SCIENCE
ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Vol.258, Iss. 10
2,103
0169-4332
K.V. Ignatovich, A.V. Zotov, A.A. Saranin. Characterization of Si(111)root3xroot3-(Au,In) surface by optical second-harmonic generation. Appl.Surf.Sci., 2012, Vol.258, Iss. 10, P.4642-4644.