ИАПУ ДВО РАН

Characterization of Si(111)root3xroot3-(Au,In) surface by optical second-harmonic generation


2012

Статьи в журналах

APPLIED SURFACE SCIENCE

ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS

Vol.258, Iss. 10

2,103

0169-4332

K.V. Ignatovich, A.V. Zotov, A.A. Saranin. Characterization of Si(111)root3xroot3-(Au,In) surface by optical second-harmonic generation. Appl.Surf.Sci., 2012, Vol.258, Iss. 10, P.4642-4644.

http://dx.doi.org/10.1016/j.apsusc.2012.01.046