ИАПУ ДВО РАН

Scanning tunneling microscopy study of the early stages of epitaxial growth of CoSi2 and CoSi films on Si(111) substrate: Surface and interface analysis


2016

Thin Solid Films, Q3

Статьи в журналах

Thin Solid Films

SWITZERLAND, LAUSANNE, ELSEVIER SCIENCE SA

Vol. 619

1,761

0040-6090

V.G. Kotlyar, A.A. Alekseev, D.A. Olyanich, T.V. Utas, A.V. Zotov, A.A. Saranin. Scanning tunneling microscopy study of the early stages of epitaxial growth of CoSi2 and CoSi films on Si(111) substrate: Surface and interface analysis. Thin Solid Films, 2016, Vol. 619, P. 153-159.

http://dx.doi.org/10.1016/j.tsf.2016.11.006